On-demand webinar:
Raman microscopy workflows for particles, coatings and semiconductors
Discover how Raman microscopy can be used to characterise pharmaceutical particles, verify coating quality and evaluate semiconductor materials
Webinar abstract
Advanced automation and efficient workflows are key features of the Strada® Intelligent Raman Microscope, enabling the collection of large and reliable datasets. Statistically significant Raman data can support decision-making across diverse applications, including pharmaceutical particle characterisation, coating QA/QC, and semiconductor analysis.
In this webinar, we will demonstrate how the Strada system can be used to analyse a range of industrial examples:
- Particle characterisation in nasal sprays and suspensions
Morphologically directed Raman spectroscopy (MDRS) and Raman imaging were used to analyse pharmaceutical formulations. The accuracy and speed of particle size distribution (PSD) measurements and chemical identification is compared across both techniques. Our results highlight the advantages and limitations of each approach, and why having both methodologies is crucial. - CVD coating verification for metrology and precision manufacturing
Raman imaging of coated components can provide insight into coating uniformity, phase composition, stress and strain, and sp²/sp³ carbon content. This information complements X-ray fluorescence (XRF) measurements and can form part of a comprehensive industrial QA/QC workflow. - Material characterisation and process monitoring of Ga2O3 semiconductors
Raman spectroscopy is sensitive to polymorphism, defects, stress and strain, crystallinity, and crystal orientation in Ga₂O₃ semiconductor wafers. It can be readily implemented as a fast, non-destructive technique for monitoring material quality and optimising growth and processing conditions throughout semiconductor manufacturing.
Presenters
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Tim Smith
Head of Raman Products and
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Zeke Haugen
Applications Scientist
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Additional resources
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