Performance
Sensitivity: Analyse sub-micrometre particles, weak Raman scatterers, low concentration solutions and trace contaminants alongside traditional materials. Measure the weakest Raman bands such as the 4th order of silicon quickly and with world leading signal-to-noise.
Resolution: Differentiate between materials with confidence. Spectral resolution better than 1 cm-1. Spatial resolution down to 250 nm.
Speed: Quickly generate Raman images and maps of large areas, up to centimetres in size. Our innovative scanning techniques achieve data collection speeds >1000 spectra/s.